United States
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JEOL is the world’s leading supplier of electron microscopes, with over 70 years of microscopy expertise and support that spans the lifetime of the instrument. Our Scanning Electron Microscopes range from the versatile benchtop SEMs to large chamber SEMs to ultrahigh resolution analytical field emission SEMS. Advanced automation, live EDS analysis, and particle analysis software streamline SEM workflow. We offer sample preparation instruments including broad and focused ion beam milling. JEOL Transmission Electron Microscopes are renowned for advanced research in materials science. Our product lineup ranges from multipurpose LaB6 TEM to high throughput S/TEM with Cold FEG to atomic resolution next-generation Cs corrected TEM.

Brands: Scanning Electron Microscopes (SEMs) -Benchtop, Large Chamber & Field Emission SEMS. Transmission Electron Microscopes (TEMs) - LaB6 TEM, S/TEM with Cold FEG, Next-Generation Cs corrected TEM