The Xradia Versa family of submicron XRM uses patented X-ray detectors within a microscope objective turret to enable increased magnification on various sample types and sizes and push spatial resolution down to 500 nm with minimum achievable voxels of <40 nm.
Unlock new degrees of versatility for your scientific and industrial research with the most advanced 3D X-ray microscope models in the ZEISS Xradia Versa family.
Building on industry-best resolution and contrast, ZEISS Xradia Versa expand the boundaries of your non-destructive sub-micron scale imaging.
Highest Resolution and Flux
Where traditional tomography relies on single-stage geometric magnification, Xradia Versa features a combination of unique two-stage magnification optics and a high flux X-ray source to produce faster sub-micron scale resolution images. The Resolution at a Distance (RaaD) architecture enables high resolution 3D imaging of larger, denser objects including intact components and devices. The optional flat panel extension (FPX) enables rapid scans of very large samples (up to 25 kg), allowing navigation to interior regions of interest.
New Degrees of Freedom
Use the industry’s most comprehensive 3D X-ray imaging solution for advanced scientific and industrial research: Maximize absorption and phase contrast to achieve unprecedented characterisation of your materials and their properties. Unlock 3D crystallographic information with Diffraction Contrast Tomography. Improve scan speed and accuracy of large or irregular samples with advanced acquisition techniques. Apply machine learning algorithms to help with post-processing and segmentation of your samples.
Premier 4D / In Situ Solution
ZEISS Xradia 600 Series Versa can non-destructively characterize the 3D microstructure of materials under controlled perturbations (in situ), and observe the evolution of structures over time (4D). By leveraging Resolution at a Distance, the Xradia Versa maintains highest resolution across large working distances, accommodating both sample, environmental chamber, and high precision in-situ load rigs without sacrificing resolution. The Versa seamlessly integrates with other ZEISS microscopes to solve multi-scale correlative imaging challenges.
LabDCT (Diffraction Contrast Tomography), available exclusively from ZEISS, enables non-destructive mapping of orientation and microstructure in 3D. Direct visualization of 3D crystallographic grain orientation opens up a new dimension in the characterization of polycrystalline materials like metal alloys, geomaterials, ceramics, or pharmaceuticals.